MEMS accelerometers detect structural defects early
Three-axis, MEMS accelerometers perform high resolution vibration measurement with very low noise, to enable the early detection of structural defects via wireless sensor networks.
The low power consumption of the ADXL354 and ADXL355 accelerometers lengthens battery life, says Analog Devices, and allows extended product usage by reducing the time between battery changes.
Low noise performance with low power consumption makes them able to cost-effectively enable low-level vibration measurement applications such as structural health monitoring. Tilt stability deliver repeatability over temperature and time for orientation and navigation systems in unmanned aerial vehicles using inertial measurement units (IMUs) and inclinometers. By providing repeatable tilt measurement under all conditions, the accelerometers enable minimal tilt error without extensive calibration in harsh environments.
The two accelerometers offer guaranteed temperature stability with null offset coefficients of 0.15mg/C (max). The stability minimises resource and expense associated with calibration and testing effort. The hermetic package helps ensure that the end product conforms to its repeatability and stability specifications, assures the company.
With output of ±2g to ±8g full scale range (FSR), selectable digital filtering from 1.0Hz to 1.0kHz, and low noise density of 25micro/OHz at less than 200 micro A current consumption, the accelerometers are claimed to offer performance level comparable to much more expensive devices with less power consumption and BOM cost.
Both are available in a 6.0 x 6.0mm, 14-lead LCC with the ADXL354 having an analog output interface, and the ADXL355 has an SPI.