Mouser stocks high-speed ADC eval board from Texas Instruments
To demonstrate the performance of the dual 3Gsample/s, 14bit ADC32RF45 ADC with the JESD204B interface from Texas Instruments, Mouser Electronics offers the ADC32RF45 EVM. The evaluation module provides a robust environment for engineers to evaluate the upcoming ADC32RF45 ADC and design smaller, higher-performance radar, software-defined radio, test and measurement, aerospace and defence, wireless communications, and radio astronomy equipment, says the distributor.
The module includes the ADC32RF45 ADC, an onboard LMK04828 clock conditioner, transformer-coupled analogue inputs, and easy-to-use software GUI and USB interface. The dual-channel ADC enables direct conversion of RF signals up to 4GHz in the 1st, 2nd and 3rd Nyquist zones, giving designers access to the highest dynamic range and input bandwidth of any 14bit device, says the company. The noise spectral density of -155dBFS/Hz is claimed to be industry-leading, with noise performance of 58.5dB signal-to-noise ratio (SNR) at 1.8GHz input frequency to detect even the weakest signals. The multi-band digital down converter capability (DDC) per ADC channel can extract one or two sub-bands per channel, dramatically reducing the digital interface data throughput by up to 92%, as well as system size, power, and processing resource savings.
The EVM is designed to work seamlessly with the Texas Instruments TSW14J56 EVM JESD204B data capture and pattern generator card, through the High Speed Data Converter Pro (HSDC Pro) software tool for high-speed data converter evaluation.