NI Brings Semiconductor ATE Digital Capability to PXI

At NI Week, in Austin, Texas, this week, National Instruments says it can free manufacturers of RFICs, power management ICs, MEMS devices and mixed-signal ICs from the closed architectures of conventional semiconductor automated test equipment (ATE). It announced the NI PXIe-6570 digital pattern instrument and NI Digital Pattern Editor, bringing the digital test paradigm established in the semiconductor industry to the open PXI platform used in the Semiconductor Test System (STS) and advancing it with a pattern editor and debugger.

The PXIe-6570 digital pattern instrument has the test capability needed for the ICs commonly found in the wireless device supply chain and IoT devices at an economical price per pin, says the company. It features 100MVector/s pattern execution with independent source and capture engines and voltage/current parametric functions at up to 256 synchronised digital pins in a single subsystem. Users can use the open nature of PXI and the STS to add as many devices as needed to meet the device pin and site counts required in the test configuration.

 The Digital Pattern Editor software integrates editing environments for device pin maps, specifications and patterns to develop test plans faster. It has built-in tools multi-site and multi-instrument pattern bursting to expand from development into production seamlessly. Tools like shmoo plots and an interactive pin view debug and optimise tests.

 Performing characterisation and production tests with the same PXI hardware and TestStand, LabVIEW and Digital Pattern Editor software decreases data correlation, to decrease time-to-market. The small footprint of PXI hardware, inside or outside of an STS configuration, saves space on a production floor and can run from standard wall power on a characterisation lab bench.

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