Process tool inspects probe cards

For the optical inspection of probe cards, NanoFocus has launched the measuring system µsprint hp-opc 3000.

It is designed for the inspection of probe cards, which are special test devices used for standard function tests of wafers. Since wafer testing can only take place after the functional structures on a wafer are fully manufactured, damage of wafers during testing represents a significant economic loss.

The measuring system ensures that the wafers are in sound condition after testing. It consequently contributes to reducing operational costs, says the company, minimising yield losses as well as increasing quality in wafer production.

The tool has potential for wafer test locations with large-volume throughput and for the manufacturing process of probe cards, says the company, with a successful pilot system installed at a manufacturer of semiconductor elements.


    Leave a Reply

    You must be logged in to post a comment.

    Latest News from Softei

    This news story is brought to you by, the specialist site dedicated to delivering information about what’s new in the electronics industry, with daily news updates, new products and industry news. To stay up-to-date, register to receive our weekly newsletters and keep yourself informed on the latest technology news and new products from around the globe. Simply click this link to register here: Softei Registration