Source measure unit suits is precise with speed of PXI

Engineers can use the National Instruments PXIe-4135 source measure unit (SMU) to measure low-current signals and take advantage of the high channel density, fast test throughput and flexibility for applications such as wafer-level parametric test, materials research and characterisation of low-current sensors and ICs.

The SMU has a measurement sensitivity of 10fA and voltage output up to 200V.

Modular NI PXI SMUs can build parallel, high-channel-count systems in a compact form factor. They benefit from up to 68 SMU channels in a single PXI chassis that can scale to hundreds of channels to address wafer-level reliability and parallel test. Additionally, users can increase test throughput by taking advantage of a high-speed communication bus, deterministic hardware sequencing and a digital control loop technology to custom-tune the SMU response for any device under test (DUT). They can also control the SMU response through software, which removes unnecessarily long wait times for SMU settling and the flexibility to help minimise over-shoot and oscillations even with highly capacitive loads.

The interactive soft front panels can be used for making basic measurements and debugging automated applications. The driver features help files, documentation and ready-to-run example programs to assist in test code development. It includes a programming interface that works with a variety of development environments such as C, Microsoft .NET and LabVIEW system design software. Engineers can also use NI PXI SMUs with the company’s TestStand test management software, simplifying the creation and deployment of test systems in the lab or production floor.


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