Spectrometer refinement expand view for analysis
Claiming to evolve elemental analysis further, Spectro Analytical Instruments has announced the Arcos inductively coupled plasma optical emission spectrometer (ICP OES) which analyses the elemental composition of metals, chemicals and petrochemicals to deliver the critically accurate measurements that industry and academia can depend on, says the company.
Enhancements are based on customer input, coupled with advances in technologies. This version refines the original Arcos’ optical performance, wavelength coverage, sensitivity and resolution with increased flexibility, with long-term savings and a lower cost of ownership, says Spectro.
Features include a new dual side on interface (DSOI) plasma viewing option. This has two optical interfaces for added sensitivity and to eliminate contamination/matrix compatibility issues that can beset vertical-torch dual-view models. If the DSOI is not needed, a standard Spectro Arcos side-on plasma (SOP) version features a dedicated radial, single side-on interface for stability and precise performance.
There is also a multi-view plasma viewing option. Users can select either high-sensitivity axial plasma observation to excel at trace analysis or high-precision radial plasma observation for high matrix loads and organic solutions. The latter option includes a periscope-free MultiView version that enables operators to literally “turn” Spectro Arcos from true radial view into true axial view, or vice-versa, in 90 seconds. With the DSOI option, MultiView offers added sensitivity for the radial mode.
There are also line-array detectors, based on CMOS technology which are equal to or which surpass the performance of legacy CCD detectors. The technology eliminates blooming and can read low signals from trace elements even in the vicinity of intense matrix lines. It also offers a high dynamic range and eliminates on-chip cooling. Single-unit costs for CMOS detectors are drastically lower than 2-D models, added Spectro.
The company’s Optimized Rowland Circle Alignment (ORCA) polychromator optical technology delivers a high resolution over a wide spectral range (130 to 770nm total range) with what is claimed to be the industry’s best transparency below 180nm. The result is a simpler method development even in line-rich metal matrices with greater accuracy, confirmed Spectro.
The enhanced spectrometer can analyse simpler matrices in as little as 30 seconds with simultaneous performance and powerful generator/readout capabilities, allowing users to analyse more samples in less time with the assurance of full traceability.
A solid state, 2000W, laterally-diffused metal oxide semiconductor (LDMOS) generator is claimed to provide the industry’s highest power. The no-purge, UV-Plus sealed gas purification technology enables fast start up, with no chance of contamination and annual gas consumables savings up to about $3,500 (€3,000). The air-cooled ICP-OES analyser eliminates the costs of an external water-based cooling system.
Six versions are available, depending on choices of plasma viewing technology and elemental wavelength range. All versions feature an ergonomic chassis that fits any standard lab bench and can accommodate many autosamplers/sample introduction systems. There is also an Intelligent Valve System upgrade kit and a portable video camera for remote monitoring.