Test contactor can be used for QFN, SOP and QFP models
To guarantee functionality of consumer devices, Yamaichi Electronics has developed Kelvin test contactors in QFN, SOP and QFP packages for use in the lab and on the test floor.
Models in the YED274 Kelvin test contactor series have Kelvin fine pitch pins to ensure that the IC components can be tested reliably, says the company.
The test contactors are available as test sockets with fixed covers for manual component testing, and also in different variants, adapted to the component handler for volume testing.
The fine-pitch Kelvin pins are used for QFN, SOP and QFP components. To ensure the reliable contacting of component pad alloys, the pin plungers are made of hardened steel with a palladium or gold surface. The pin force of 28gf breaks reliably through the oxide in the temperature range from -55 to +150 degree C, says the company. Contact resistance is less than 50mOhm.
The contactors’ materials are selected to compensate for even large temperature spikes.