Test systems address evolving electronic manufacturing needs
Two test systems from Seica will be seen at electronica 2016, next month in Munich (8 to 11 November).
The Compact Digital and the Compact Multimedia address the evolving test requirements of electronics manufacturing as well as digitalisation of the manufacturing process, says the company.
The company’s open-architecture VIP platform, and set of software interfaces, interact with the most commonly used MES (manufacturing execution system) and traceability platforms. The systems are designed to be compliant with WCM (web content management) criteria for minimising footprint and easy access for maintenance.
The Compact Digital is equipped with a vacuum-type receiver which allows manual loading of the units under test, but it is designed for easy integration into a line where this operation may use a robot. The system can be configured with all of the analogue resources for in-circuit tests, along with powerful digital channels, extending the range from MDA/ICT (manufacturing defect analyser/ in-circuit test) and vectorless tests, to the functional test of complex digital boards.
The Compact Multimedia is a practical and versatile functional test solution configured with all of the resources needed to test multimedia products, such as infotainment platforms in the automotive sector. It can be configured to perform single, asynchronous parallel and synchronous parallel tests of up to a maximum of four units under test simultaneously, from very low value signals up to high power, telephone and satellite protocols, Bluetooth, wi-fi USB and digital video.
Space in the 19inch rack is optimised to allow integration of numerous resources, with the modularity and scalability to configure the testing requirement. The receiver can be manual or pneumatic, and the system can be driven from the company’s VIVA SW platform, from the NI Labview/TestStand environment or other commercially available software packages.
Visit Seica at electronica 2016 – hall A1- 459