Probe measures faster current transients in new semiconductor tech
Power Electronic Measurements has launched the CWTMini50HF current probe for high-speed and high power-density power electronic applications.
This higher bandwidth probe is said by PEM to be suitable for measuring the faster current transients in new semiconductor technologies where faster turn on and turn off times, higher blocking voltages and smaller circuits demand, smaller, higher temperature, faster current probes.
Using Rogowski technology, the CWTMini50HF extends the high frequency capability of the CWTMiniHF range to enable measurement of rise-times up to 12.5 nano seconds with a small 100mm, 3.5mm thick coil having a high frequency (-3dB) bandwidth of 50MHz and a peak di/dt capability of 80kA/us. This is achieved without sacrificing the probe’s excellent immunity to interference from fast local dV/dt transients, says the company.
Initially the CWTMini50HF will be available in peak current ratings of 600A and 1200A and will feature a thin 3.5mm thick coil rated for 2kV peak insulation.
PEM continues to provide Rogowski tranducers across across a broad range of applications and industries and provides advice and support to engineers with current measurement challenges. To date, PEM has exported to more than 35 countries worldwide.
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See PEM at PCIM, Hall 7 Stand 122
