Synopsys.ai EDA suite includes full stack, big data analytics
Synopsys has added AI-driven data analytics which aggregates and uses data across IC design, test, and manufacturing flow to drive more intelligent decision making.
The extension to the company’s Synopsys.ai full stack EDA suite is an AI-driven data analytics continuum for every stage of integrated circuit (IC) chip development. The Synopsys EDA Data Analytics solution is believed to be the first of its kind in the semiconductor industry to provide AI-driven insight and optimisation to drive improvements across exploration, design, manufacturing, and testing processes.
It combines the latest advances in AI to curate and operationalise magnitudes of heterogenous, multi-domain data to accelerate root-cause analysis and achieve greater design productivity, manufacturing efficiency, and test quality.
The AI-driven Synopsys EDA Data Analytics (.da) performs deep analysis of data from Synopsys.ai design execution. It provides comprehensive visibility and actionable design insights to uncover power, performance and area (PPA) opportunities, said Synopsys.
It also includes Synopsys Fab.da to store and analyse large streams of fab equipment process control data that increase operational efficiencies and maximise product quality and fab yield.
Synopsys Silicon.da is also able to collect petabytes of silicon monitor, diagnostic, and production test data from test equipment to improve chip production metrics, such as quality, yield, and throughput and silicon operation metrics, such as chip power and performance.
Sanjay Bali, vice president of strategy and product management for the EDA group at Synopsys, said: “With the new data analytics capabilities within the Synopsys.ai EDA suite, companies can now aggregate and leverage data across every layer of the EDA stack from architecture exploration, design, test, and manufacturing to drive improvements in PPA, yield, and engineering productivity.”
EDA, testing, and IC fabrication tools generate vast amounts of heterogeneous design data such as timing paths, power profiles, die pass/fail reports, process control, or verification coverage metrics. Leveraging this data is critical for improving productivity, PPA, and parametric/manufacturing yield. Extending the Synopsys.ai full-stack EDA suite with a big data analytics solution provides multi-domain data aggregation and curation through AI-driven flows and methodologies that deliver significant productivity gains with improved QoR.
With deeper design insights, chip designers can achieve more effective debug and optimisation workflows. IC suppliers can also rapidly localise and correct problem areas throughout mask, fabrication, and test processes before they impact product quality and yield. Companies also benefit from generative AI methods on their data sets to enable new use cases like knowledge assistants, pre-emptive and prescriptive what-if exploration, and guided issue resolution.
The Synopsys EDA Data Analytics solution, including Synopsys Design.da, Synopsys Fab.da and Synopsys Silicon.da, are available now.
