300MHz PXI/PXIe modules increase RF switching density
Modular signal switching and simulation provider, Pickering Interfaces, has introduced integrated PXI RF matrix modules with a 32×8 topology. This represents a 33 per cent increase in matrix density per chassis slot, said Pickering. The 40-724 PXI and 42-724 PXIe modules have a compact footprint and provide high performance with a usable bandwidth of 300MHz for non-loop-through models.
Designed for simple scalability, the modules have options with loop-through ports on the Y-axis for larger applications requiring matrix expansion. To provide the maximum granularity of test system construction, the 4x-724 family is available in four matrix sizes: 16×4, 16×8, 32×4 and the fully populated 32×8.
Loop-through enabled options are provided for each matrix size. The loop-through ports are connected directly to the matrix. This differentiates it from other RF matrix products, argued Pickering, because it allows the creation of X-to-X signal paths between cards when cascading multiple modules. This feature increases test system flexibility but with reduced RF performance, added the company.
The 40-724 PXI and 42-724 PXIe modules build on existing Pickering RF matrix module technology to increase the maximum matrix size to 32×8 for use in 50 Ohm test applications. The increased density allows complex switching systems to be produced while requiring only two chassis slots.
The 4x-724 RF matrix modules feature ruthenium-sputtered reed relays. In addition to a long service life, reed relays have an operating time of just 0.5 ms (typical), which is significantly shorter than electromechanical-based solutions. As a result, their use minimises the test cycle duration and increasing product test throughput.
The modules are available with a PXI or PXIe control interface and all versions use industry-standard SMB connectors to maximise system performance while simplifying the interface to external instrumentation and devices under test (DUTs).
The 4x-724 RF matrix modules are aimed at general-purpose RF testing in a variety of applications, including emergency radios and semiconductor test. All versions of the 4x-724 are supported by Pickering’s eBIRST switching system test tools that can be used for preventative maintenance tests to determine if relays are approaching end-of-life. The eBIRST tools also allow fast fault finding, minimising system downtime.
