Keysight enhances network analysers to accelerate measurement taking

Enhancements to the PNA and PNA-X performance network analysers deliver greater flexibility and accuracy while speeding and simplifying required measurements, says Keysight Technologies.

The network analysers are used in the RF and microwave industry to provide measurement capabilities that characterise a range of devices, components and systems. Measurements for active devices, including noise figure, gain compression and intermodulation distortion (IMD), can be complex, especially on modern high-frequency devices. To address these challenges, Keysight’s enhanced PNA and PNA-X network analysers contain a proprietary low-spurious direct digital synthesis (DDS) source, enabling customers to take accurate measurements with less phase noise interference. With the clean source signals, customers can perform two-tone IMD measurements with close tone spacing previously only possible with high-performance analogue signal generators. The DDS sources also enhance the performance of a range of software applications, including modulation distortion, SMC with phase, and I/Q converter measurements, for fast mixer/frequency converter characterisation, says Keysight.

A third RF source up to 13.5GHz on the PNA-X simplifies measurement set-up by taking the place of an external signal generator to drive local oscillators.

Joe Rickert, vice president and general manager of high frequency measurement R&D for Keysight’s communications solutions group, commented: “Our new PNA family delivers the right mix of speed and performance to reduce these test times, enabling faster insight with simplified measurement setups and the accuracy they need to improve their designs.”

Keysight’s PNA (high performing, cost effective network analyser) and PNA-X (an integrated and flexible single-connection microwave test engine for measuring active devices) simplify test stations by replacing racks and stacks of equipment. They also reduce test time with a range of single-connection measurement applications. The analysers also have accurate linear and non-linear device characterisation using advanced error correction, while a multi-touch display and intuitive user interface accelerates insight into component behaviour.

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