XJTAG adds features to boundary scan tools to automate and over-ride

Two features, added by XJTAG to its boundary scan tools are designed to enhance ease of use. XJTAG 3.10 introduces an automated method for incorporating design updates when they occur on the board being tested; the other feature is a simple way to over-ride the default settings of global variables used by XJEase device files.

The Board Revisions feature uses an intelligent device-matching algorithm to analyse a new netlist and identify devices that have had reference designators changed. It copies their categorisation information to the new project and automatically updates all references. If devices have been removed from the circuit, these are highlighted to the user. The matches and suggestions are presented in a user-friendly format that shows the reasons for the suggestions while guiding the user through the updating process. The schematic viewer, layout viewer, and netlist explorer are implemented to provide the most user-friendly way to present the information the user needs when validating these proposed updates, XJTAG explains.

The second enhancement to XJTAG 3.10 provides a simple-to-use dialogue box that allows users to over-ride the default values of the global variables used in XJEase device files. This allows global variables to be set easily and quickly for a specific device using a method that does not require coding which means it avoids the risks associated with editing device files directly. Each device can have its own set of global variables instead of them needing to be common to all ICs that use the same device file. For example, users can set up testing so that debug data for one specific IC is output, even when the board being tested uses more than one of that particular component.

XJTAG 3.10 is available now for download from www.xjtag.com for existing clients with a valid maintenance contract. Fully-featured trials with free initial test project set up are available at no charge to new clients.

http://www.xjtag.com

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