Jitter decomposition is an option for signal integrity debugging
Engineers can now separate jitter into its random and deterministic components and view results flexibly for effective debugging with the option introduced by Rohde & Schwarz for its RTO and RTP oscilloscope.
The advanced jitter analysis option offers development engineers more insight into the individual jitter components of the transmission interface and allows them to separate jitter and view results for what was previously unavailable in-depth knowledge for debugging high speed signals, says Rohde & Schwarz. Its decomposition algorithm uses a parametric signal model for accurate measurements and additional result representations.
As data rates increase and voltage swings decrease, the jitter in digital interfaces becomes a significant percentage of the signalling interval and potential source of failures. Increasingly, engineers require tools that accurately characterise the signal jitter including the break-down into its individual components.
The R&S RTO-/ RTP-K133 advanced jitter analysis option introduces an analytic approach to separating the individual components of jitter such as random jitter, and deterministic jitter components, such as data dependent and periodic jitter. This approach is based on a parametric signal model that characterises the behaviour of the transmission link under test.
According to Rohde & Schwarz, this method produces the benefit of the jitter model including the complete waveform characteristic of the signal under test. Conventional methods reduce the data to a set of time interval error measurements. The result is consistent measurement data even for relatively short signal sequences, reports the company, together with previously unavailable information such as the step response, or a distinction between vertical and horizontal periodic jitter. Engineers benefit from in-depth details with jitter representations such as synthetic eye diagrams, histograms of all individual jitter components, spectral and peak views of periodic jitter, and the bathtub plot for estimating bit error rate.
The jitter separation option extends the signal integrity debugging functions for engineers, complementing the industry’s only integrated time-domain reflectometry (TDR)/ time-domain transmissometry (TDT) measurement and real-time de-embedding capabilities in a single oscilloscope.
The option R&S RTx-K133 for R&S RTO and R&S RTP oscilloscopes is now available from Rohde & Schwarz.
Visit Rohde & Schwarz at DesignCon 2020 (booth 623) at the Santa Clara Convention Center, Santa Clara, California, USA, 28 to 30 January.
